Equipment

XRADIA VERSA 520

X-ray computer microtomograph Zeiss Xradia Versa 520. The main purpose is non-destructive examination of geometry and internal structure with high spatial resolution (not worse than 1 micron).

Capabilities:

1. Quantitative determination of density (in g / cm3) at any point in the sample.
2. Obtaining virtual sections and sections of the sample without destroying it.
3. Detection and measurement of microdefects, voids and inclusions.
4. Quantification of the total porosity of the material.
5. Density mapping, marking of sites by density levels.
6. Export of volumetric geometry of the sample in .STL format for 3D printing, programming of CNC machines or for computer modeling (ANSYS, etc.)
7. The investigated object can be in air or in a liquid.

Specifications:

1. X-ray source type: closed shot tube,
2. accelerating voltage: from 20 kV to 160 kV,
3. power: from 1 to 10 W,
4. maximum sample size: diameter – up to 260 mm, height – up to 300 mm,
5. spatial resolution: not worse than 700 nm,
6. minimum voxel size: 70 nm.